Subject: He-Focused Ion Beam imaging gen. Помогите, пожалуйста, перевести:Experimental investigations of the microstructures of the as-deposited and reacted multilayers by in situ high-temperature XRD, He-Focused Ion Beam imaging, AES and XPS depth-profiling techniques and High Resolution TEM Cпасибо! |
You need to be logged in to post in the forum |