Subject: проверьте пож-та предложение, очень нужно gen. Internal visual inspection after mechanical decapsulation of representative units SN1 and SN4 did not show any die surface anomalies. В ходе внутреннего осмотра, после механического вскрытия SN1 и SN4 не было выявлено дефектов на поверхности кристалла.Контекст такой: External visual inspection did not show any package-related anomalies. Curve trace analysis did not show I-V curve anomalies. ADI’s manufacturing line electrical verification using an Automatic Test Equipment (ATE) showed that the units are failing the functionality tests, including the accuracy test parameter. Fine Leak and Gross Leak tests showed that the package of the units is intact. Internal visual inspection after mechanical decapsulation of representative units SN1 and SN4 did not show any die surface anomalies. Light Emission Microscope (LEM) analysis of SN1 and SN4 showed an anomalous emission at PMOS transistor within the internal circuitry. Internal visual inspection after chemical deprocessing until the exposure of the substrate of the representative units showed burnt area on the bottom plate of the capacitor and metal line connected to Pin 42 (INTEGRATOR I/P). Scanning Electron Microscope (SEM) analysis of the defect site confirmed the burnt area on the bottom plate of the capacitor connected to the PMOS transistor with anomalous emission.
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