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link 21.03.2012 15:29 |
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Subject: CDRM electr.eng. Section 2.3.5 already fitted a correction factor CDRM on results from static resistance measurements, in order to correct measurement results for this effect.
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| так и оставьте |
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CDRM the correction for differences in the measurement current during the dynamic resistance measurement. Figure 2.19 The calculated resistance R(t) can be corrected for wiping action of the contact film caused by OLTC operation (COLTC) and for the damage to the film caused by the measurement current during the resistance measurement (CDRM). |
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