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External visual inspection did not show any package-related anomalies. Curve trace analysis did not show I-V curve
anomalies. ADI’s manufacturing line electrical verification using an Automatic Test Equipment (ATE) showed that the
units are failing the functionality tests, including the accuracy test parameter. Fine Leak and Gross Leak tests showed
that the package of the units is intact.
Internal visual inspection after mechanical decapsulation of representative units SN1 and SN4 did not show any die
surface anomalies. Light Emission Microscope (LEM) analysis of SN1 and SN4 showed an anomalous emission at
PMOS transistor within the internal circuitry. Internal visual inspection after chemical deprocessing until the exposure
of the substrate of the representative units showed burnt area on the bottom plate of the capacitor and metal line
connected to Pin 42 (INTEGRATOR I/P). Scanning Electron Microscope (SEM) analysis of the defect site confirmed
the burnt area on the bottom plate of the capacitor connected to the PMOS transistor with anomalous emission.